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dc.contributor.authorKurtulmus, A
dc.contributor.authorElbay, A
dc.contributor.authorParlakkaya, FB
dc.contributor.authorKilicarslan, T
dc.contributor.authorOzdemir, MEHMET HAKAN
dc.contributor.authorKirpinar, I
dc.date.accessioned2020-01-21T20:59:16Z
dc.date.available2020-01-21T20:59:16Z
dc.date.issued2020-01-14T00:00:00Z
dc.identifier.urihttps://openaccess.bezmialem.edu.tr/handle/20.500.12645/13467
dc.language.isoen
dc.subjectKurtulmus A., Elbay A., Parlakkaya F., Kilicarslan T., Ozdemir M. H. , Kirpinar I., -An investigation of retinal layer thicknesses in unaffected first-degree relatives of schizophrenia patients.-, Schizophrenia research, 2020
dc.titleAn investigation of retinal layer thicknesses in unaffected first-degree relatives of schizophrenia patients.
dc.typeArticle
dc.identifier.doi10.1016/j.schres.2019.12.034
dc.identifier.pubmed31948898
local.publication.isinternational1


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